People : Denis E. Tranca

Denis-Emanuil Tranca has graduated the Faculty of Electronics, Telecommunications and Information Technology at Politehnica University of Bucharest in 2010. His license degree was obtained based on his study about counter-propagating light-solitons interactions in nonlinear optical materials which was elaborated during his four months Erasmus grant in SUPELEC University in Metz, France. He received a Master’s degree diploma in the field of Optoelectronics from Politehnica University of Bucharest in 2012; his master thesis was dealing with both theoretical and experimental studies on scattering scanning near-field optical microscopy technique with its applications in metallic samples investigations.  Currently he is a PhD student at Politehnica University of Bucharest and his research interests are related to scanning probe microscopy, high-resolution optical microscopy techniques (especially different variants of scattering scanning near-field optical microscopy), new detection and investigation applications for scattering scanning near-field optical microscopy and also image processing techniques. He’s been  involved in the research activities that take place at the Center for Microscopy-Microanalysis and Information Processing (CMMIP-UPB) since November 2011.